APS

2022 APS Annual Convention · 2022

Bayesian Model Fit and Selection Indices for Detecting Misspecification: The Case of Bayesian Piecewise Growth Modeling

Chicago, IL · May 2022

Poster · Methodology

  • Ihnwhi Heo
    University of California, Merced
  • Fan Jia
    University of California, Merced
  • Sarah Depaoli
    University of California, Merced

Abstract

We examined the performance of Bayesian model fit and selection indices (CFI, TLI, BIC, DIC, RMSEA, and posterior predictive p-value) to detect model misspecification in Bayesian piecewise growth models. The indices produced disparate performance from one another across various conditions of growth trajectory, sample size, knot location, and prior specification.

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