APS

2025 APS Annual Convention · 2025

How to Lie With Fit Statistics

Washington, DC · May 2025

Invited Symposium · Methodology

  • Wes Bonifay
    University of Missouri-Columbia

Abstract

In statistical modeling, goodness of fit allows researchers to bolster their claims, confirm their theories, and increase their chances of publication. In this presentation, I will teach you how to use fit statistics to perpetrate lies of commission and of omission when analyzing your data and disseminating your findings.

← Model Evaluation and Its Discontents