APS

2025 APS Annual Convention · 2025

How to Lie With Fit Statistics

Washington, DC · May 2025

Invited Symposium · Methodology

Session: Model Evaluation and Its Discontents

Authors

  • Wes BonifayPresenting Author
    University of Missouri-Columbia

Abstract

In statistical modeling, goodness of fit allows researchers to bolster their claims, confirm their theories, and increase their chances of publication. In this presentation, I will teach you how to use fit statistics to perpetrate lies of commission and of omission when analyzing your data and disseminating your findings.