APS

29th APS Annual Convention · 2017

Measures of Paternalistic Leadership: A Reliability Generalization Analysis

Boston, MA · May 2017

Poster Session · Methodology

  • Sibel Ozgen Novelli
    Florida International University
  • Ajay Ponnapalli
    Florida International University
  • Nathan Hiller
    Florida International University
  • Hock-Peng Sin
    Florida International University

Abstract

We examined psychometric properties of two well-known measures of a non-Western leadership style, Paternalistic Leadership, by providing meta-analytically generalized mean reliability scores and identifying study characteristics that cause systematic variations in these scores. Our findings have implications for the use of these measures in cross-cultural settings.

Psychometrics

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